Catalog of standards
Catalog of standards
17
METROLOGY AND MEASUREMENT. PHYSICAL PHENOMENA
17.040
Linear and angular measurements
17.040.01
Linear and angular measurements in general
| Reference number of the normative document | Title of the normative document | Կարգավիճակը | Developer of the normative document and its address | Price in Armenian drams (AMD) (including VAT) |
Cart |
| GOST 8.591-2009 | State system for ensuring the uniformity of measurements. Nanometer range relief measures with trapezoidal profile of elements. Verification method | Active |
- |
4800 |
Russian |
| GOST 8.592-2009 | State system for ensuring the uniformity of measurements. Single-crystal silicon nanometer range relief measures. Geometrical shapes, linear size and manufacturing material requirements | Active |
- |
2400 |
Russian |
| GOST 8.593-2009 | State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Verification method | Active |
- |
2800 |
Russian |
| GOST 8.594-2009 | State system for ensuring the uniformity of measurements. Scanning electron microscopes. Verificationmethods | Active |
- |
3200 |
Russian |
